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BS PD IEC TS 62607-6-3:2020

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BS PD IEC TS 62607-6-3:2020 Nanomanufacturing. Key control characteristics

standard by BSI Group, 11/02/2020

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Full Description

This part of IEC TS 62607 establishes a standardized method to determine the structural keycontrol characteristic

- domain size
for films consisting of graphene grown by chemical vapour deposition (CVD) on copper by
- substrate oxidation.

All current amendments available at time of purchase are included with the purchase of this document.

Product Details

Published: 11/02/2020 ISBN(s): 9780580973338 Number of Pages: 26 File Size: 1 file , 5.5 MB Product Code(s): 30355585, 30355585, 30355585

M00011118
2021-02-16
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