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IEC 61967-6 Ed. 1.0 b:2002
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IEC 61967-6 Ed. 1.0 b:2002 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
standard by International Electrotechnical Commission, 06/25/2002
Full Description
Specifies a method for evaluating RF currents on the pins of an integrated circuit (IC) by means of non-contact current measurement using a miniature magnetic probe. This method is capable of measuring the RF currents generated by the IC over a frequency range of 0,15 MHz to 1 000 MHz.
M00001116
2021-02-22
New product
IEC 61967-6 Ed. 1.0 b:2002 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
standard by International Electrotechnical Commission, 06/25/2002