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IEC 62374 Ed. 1.0 b:2007

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IEC 62374 Ed. 1.0 b:2007 Semiconductor devices - Time dependent dielectric breakdown (TDDB) test for gate dielectric films

standard by International Electrotechnical Commission, 03/29/2007

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Provides a test method of Time Dependent Dielectric Breakdown (TDDB) for gate dielectric films on semiconductor devices and a product lifetime estimation method of TDDB failure

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Edition: 1.0 Published: 03/29/2007 Number of Pages: 43 File Size: 1 file , 720 KB

M00001177
2021-02-22
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