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IEEE 1445-2016
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IEEE 1445-2016 IEEE Standard for Digital Test Interchange Format (DTIF)
standard by IEEE, 01/27/2017
Full Description
Scope
This standard defines DATPG output data formats and informational content for UUT models, stimulus and response patterns, fault dictionaries, and diagnostic probing. These outputs provide a standard exchange format to automatic test equipment (ATE).Purpose
This standard is to be used as the standard definition of DATPG output formats and informational content.Abstract
Revision Standard - Active.The information content and the data formats for the interchange of digital test program data between digital automated test program generators (DATPGs) and automatic test equipment (ATE) for board-level printed circuit assemblies are defined. This information can be broadly grouped into data that defines the following: user under test (UUT) model, stimulus and response, fault dictionary, and probe.
M00001186
2021-02-20
New product
IEEE 1445-2016 IEEE Standard for Digital Test Interchange Format (DTIF)
standard by IEEE, 01/27/2017